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Portable roughness /surface profiler testers ALPA WRP LA253

This new roughness tester revolutionises roughness measurement. Large 7-inch touchscreen display with 16 million colours. 81 roughness parameters according to major international standards. Integrated CAD for profile analysis. Wide 5000μm measuring range in roughness and profilometry. Resolution 0.1nm (0.0001μm) over 5000μm. Automatic save last 6 measurements, manual save up to 1000 profilometry measurements and 4000 roughness measurements (graphs+parameters). - Measuring range: Z = 5000 μm - Resolution: 0.1 nm (0.0001 μm) over ± 1500 μm - Cut-off length: 0.08 - 0.25 - 0.8 - 2.5 - 8 mm - Number of cut-offs: 1 to 20 cut-offs (within 60 mm useful X) - Scanning stroke: X=60 mm - Probe: Differential inductive probe with interchangeable rods (Carbon end only) - Measurement parameters: 81 parameters - Ra, Rq, Rt, Rz, Rp, Rv, Rc, Rsk, Rku, RSm, RΔq, RΔa, Rmax, Rδc, Rmr, Rmr(c), RPc, RLo, Rlr, Rzjis, RHSC, R3z, hp, Ep, Pa, Pq, Pt, Pv, Pc, Psk, Pku, PSm, PΔq, Pδc, PPc, PLo, Plr, PHSC, Wa, Wq, Wt, Wz, Wp, Wv, Wc, Wsk, Wku, WSm, WΔq, Wδc, WPc, WLo, Wlr, WHSC, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rpk*, Rvk*, WDSm, WDc, WDt, R, AR, Rx, W, Aw, Wx, Wte, Rke, Rpke, Rvke, Mr1e, Mr2e, A1e, A2e - Units of measurement: millimetres and inches - Interface: 7 inch touch screen graphic display - Languages: Italian, French, English, German, Spanish, Portuguese, Japanese, Chinese, Korean - Memory: up to 4000 roughness and 1000 profilometre measurements
Fabricant: ALPA

Description

This new roughness tester revolutionises roughness measurement. Large 7-inch touchscreen display with 16 million colours. 81 roughness parameters according to major international standards. Integrated CAD for profile analysis. Wide 5000μm measuring range in roughness and profilometry. Resolution 0.1nm (0.0001μm) over 5000μm. Automatic save last 6 measurements, manual save up to 1000 profilometry measurements and 4000 roughness measurements (graphs+parameters). - Measuring range: Z = 5000 μm - Resolution: 0.1 nm (0.0001 μm) over ± 1500 μm - Cut-off length: 0.08 - 0.25 - 0.8 - 2.5 - 8 mm - Number of cut-offs: 1 to 20 cut-offs (within 60 mm useful X) - Scanning stroke: X=60 mm - Probe: Differential inductive probe with interchangeable rods (Carbon end only) - Measurement parameters: 81 parameters - Ra, Rq, Rt, Rz, Rp, Rv, Rc, Rsk, Rku, RSm, RΔq, RΔa, Rmax, Rδc, Rmr, Rmr(c), RPc, RLo, Rlr, Rzjis, RHSC, R3z, hp, Ep, Pa, Pq, Pt, Pv, Pc, Psk, Pku, PSm, PΔq, Pδc, PPc, PLo, Plr, PHSC, Wa, Wq, Wt, Wz, Wp, Wv, Wc, Wsk, Wku, WSm, WΔq, Wδc, WPc, WLo, Wlr, WHSC, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rpk*, Rvk*, WDSm, WDc, WDt, R, AR, Rx, W, Aw, Wx, Wte, Rke, Rpke, Rvke, Mr1e, Mr2e, A1e, A2e - Units of measurement: millimetres and inches - Interface: 7 inch touch screen graphic display - Languages: Italian, French, English, German, Spanish, Portuguese, Japanese, Chinese, Korean - Memory: up to 4000 roughness and 1000 profilometre measurements Standard equipment: - Roughness probe with diamond cone 90° angle radius 2 μm - Profilometry probe with 11° angle chisel - Profilometry software - Calibration sample for Roughness Ra = 2.97 μm - Battery charger